DocumentCode :
687372
Title :
Fabrication and characterization of large area Cd0.9Zn0.1Te guarded pixelated detector
Author :
Chaudhuri, S.K. ; Nguyen, Khanh ; Pak, Rahmi O. ; Matei, Liviu ; Buliga, Vladimir ; Groza, M. ; Burger, A. ; Mandal, Krishna C.
Author_Institution :
Electr. Eng. Dept., Univ. of South Carolina, Columbia, SC, USA
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
5
Abstract :
Cd0.9Zn0.1Te (CZT) gamma radiation detectors are presently among the best semiconductor materials for room temperature operation. CZT crystals in pixilated geometry can be efficiently used in the field of Homeland security and medical diagnosis for high resolution imaging purpose and position sensitive measurements using x-rays and high energy gamma rays. Large area CZT single crystals has been grown using a tellurium solvent method. A 10×10 guarded pixilated detector has been fabricated on a ~19.5×19.5×5 mm3 crystal cut out from the grown ingot. A full area planar Au contact was used as the cathode. Each pixel of the pixilated detector was 1.3×1.3 mm2 in area and pitched at 1.8 mm. A 100 μm wide guard grid was used to reduce inter-pixel leakage. The crystal was characterized in planar configuration using electrical and optoelectronic methods prior to the fabrication of pixilated geometry. Current-voltage (I-V) measurements revealed a leakage current of 29 nA at an operating bias voltage of 1100 V. A resistivity of ~3.1×1010 Ω·cm was calculated from the I-V measurements. Infrared transmission imaging revealed an average tellurium inclusion/precipitate size less than 8μm. Pockels measurement has revealed a near-uniform depth-wise distribution of the internal electric field. The mobility-lifetime product in this crystal was calculated to be 6.2 × 10-3 cm2/V using alpha ray spectroscopic method. Gamma spectroscopy using a 137Cs source on the pixelated structure showed fully resolved 662 keV gamma peaks for all the pixels, with percentage resolution (FWHM) as low as 1.8 %.
Keywords :
II-VI semiconductors; cadmium compounds; carrier mobility; electrical resistivity; gamma-ray detection; gamma-ray spectroscopy; infrared imaging; leakage currents; semiconductor counters; zinc compounds; Au; Cd0.9Zn0.1Te; alpha ray spectroscopic method; cathode; current 29 nA; current-voltage measurements; full area planar gold contact; gamma radiation detectors; gamma spectroscopy; infrared transmission imaging; internal electric field; interpixel leakage reduction; large area CZT guarded pixelated detector; leakage current; mobility-lifetime product; near-uniform depth-wise distribution; planar configuration; resistivity; tellurium solvent method; voltage 1100 V; Crystals; Detectors; Energy resolution; Fabrication; Image quality; Spectroscopy; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829827
Filename :
6829827
Link To Document :
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