DocumentCode :
687389
Title :
Detection of light, X-rays, and gamma rays using graphene field effect transistors fabricated on SiC, CdTe, and AlGaAs/GaAs substrates
Author :
Koybasi, Ozhan ; Cazalas, Edward ; Childres, Isaac ; Jovanovic, Igor ; Chen, Yongpin P.
Author_Institution :
Dept. of Phys. & Birck Nnaotechnology Center, Purdue Univ., West Lafayette, IN, USA
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
6
Abstract :
Our work demonstrates the potential of gated graphene field effect transistors (GFETs) fabricated on a variety of undoped semiconductor substrates such as SiC, CdTe, and GaAs to sense ionizing radiation with promise of high sensitivity, low noise, low power, and room temperature operation. We exploit distinct material properties of different substrates to address different application regimes. Radiation detection with GFET is based on the high sensitivity of graphene resistivity on local electric field perturbations caused by ionized charges generated in the radiation absorbing semiconductor substrate. Light, X-rays, and gamma rays have been detected in our experiments.
Keywords :
X-ray detection; aluminium compounds; cadmium compounds; electric fields; field effect transistors; gallium arsenide; gamma-ray detection; graphene; low-power electronics; silicon compounds; AlGaAs-GaAs; CdTe; GFET; SiC; X-rays detection; distinct material properties; gamma rays detection; gated graphene field effect transistors; graphene resistivity; ionizing radiation; light detection; local electric field perturbations; low noise operation; low power operation; radiation absorbing semiconductor substrate; radiation detection; temperature 293 K to 298 K; undoped semiconductor substrates; Electrical resistance measurement; Graphene; Logic gates; Resistance; Semiconductor device measurement; Substrates; X-rays; field effect transistor; graphene; ionizing radiation; radiation sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829845
Filename :
6829845
Link To Document :
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