• DocumentCode
    687389
  • Title

    Detection of light, X-rays, and gamma rays using graphene field effect transistors fabricated on SiC, CdTe, and AlGaAs/GaAs substrates

  • Author

    Koybasi, Ozhan ; Cazalas, Edward ; Childres, Isaac ; Jovanovic, Igor ; Chen, Yongpin P.

  • Author_Institution
    Dept. of Phys. & Birck Nnaotechnology Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Our work demonstrates the potential of gated graphene field effect transistors (GFETs) fabricated on a variety of undoped semiconductor substrates such as SiC, CdTe, and GaAs to sense ionizing radiation with promise of high sensitivity, low noise, low power, and room temperature operation. We exploit distinct material properties of different substrates to address different application regimes. Radiation detection with GFET is based on the high sensitivity of graphene resistivity on local electric field perturbations caused by ionized charges generated in the radiation absorbing semiconductor substrate. Light, X-rays, and gamma rays have been detected in our experiments.
  • Keywords
    X-ray detection; aluminium compounds; cadmium compounds; electric fields; field effect transistors; gallium arsenide; gamma-ray detection; graphene; low-power electronics; silicon compounds; AlGaAs-GaAs; CdTe; GFET; SiC; X-rays detection; distinct material properties; gamma rays detection; gated graphene field effect transistors; graphene resistivity; ionizing radiation; light detection; local electric field perturbations; low noise operation; low power operation; radiation absorbing semiconductor substrate; radiation detection; temperature 293 K to 298 K; undoped semiconductor substrates; Electrical resistance measurement; Graphene; Logic gates; Resistance; Semiconductor device measurement; Substrates; X-rays; field effect transistor; graphene; ionizing radiation; radiation sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829845
  • Filename
    6829845