DocumentCode :
687392
Title :
Characterization of non-equilibrium carriers in CdZnTe crystal using time-of-fight technique
Author :
Tao Feng ; Gangqiang Zha ; Rongrong Guo ; Guangqi Wang ; Yadong Xu ; Wanqi Jie
Author_Institution :
State Key Lab. of Solidification Process., Northwestern Polytech. Univ., Xi´an, China
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
6
Abstract :
Time-of-Fight technique is an effective way to obtain the drift mobility and recombination life time of CdZnTe crystal. The recombination, drift and diffusion of non-equilibrium carrier all influence the light induced current. But in different time, the attenuation of the photocurrent is relay on different processes. In this letter, we separate the decay of the pulse laser induced current to three parts, so the analysis of the non-equilibrium carriers in CdZnTe crystal is precise. And we also use IV measurements and measurements gamma ray spectra to characterize the carriers in CdZnTe crystal.
Keywords :
II-VI semiconductors; cadmium compounds; carrier lifetime; carrier mobility; diffusion; gamma-ray spectra; photoconductivity; time of flight spectra; wide band gap semiconductors; zinc compounds; CdZnTe; IV measurements; diffusion; drift mobility; gamma ray spectra measurements; light induced current; nonequilibrium carriers; photocurrent attenuation; pulse laser induced current; recombination lifetime; time-of-fight technique; Charge carrier processes; Conductivity; Crystals; Detectors; Fitting; Gamma-rays; Voltage measurement; CdZnTe; TOF; gamma-ray; lifetime; mobility;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829848
Filename :
6829848
Link To Document :
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