• DocumentCode
    687392
  • Title

    Characterization of non-equilibrium carriers in CdZnTe crystal using time-of-fight technique

  • Author

    Tao Feng ; Gangqiang Zha ; Rongrong Guo ; Guangqi Wang ; Yadong Xu ; Wanqi Jie

  • Author_Institution
    State Key Lab. of Solidification Process., Northwestern Polytech. Univ., Xi´an, China
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Time-of-Fight technique is an effective way to obtain the drift mobility and recombination life time of CdZnTe crystal. The recombination, drift and diffusion of non-equilibrium carrier all influence the light induced current. But in different time, the attenuation of the photocurrent is relay on different processes. In this letter, we separate the decay of the pulse laser induced current to three parts, so the analysis of the non-equilibrium carriers in CdZnTe crystal is precise. And we also use IV measurements and measurements gamma ray spectra to characterize the carriers in CdZnTe crystal.
  • Keywords
    II-VI semiconductors; cadmium compounds; carrier lifetime; carrier mobility; diffusion; gamma-ray spectra; photoconductivity; time of flight spectra; wide band gap semiconductors; zinc compounds; CdZnTe; IV measurements; diffusion; drift mobility; gamma ray spectra measurements; light induced current; nonequilibrium carriers; photocurrent attenuation; pulse laser induced current; recombination lifetime; time-of-fight technique; Charge carrier processes; Conductivity; Crystals; Detectors; Fitting; Gamma-rays; Voltage measurement; CdZnTe; TOF; gamma-ray; lifetime; mobility;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829848
  • Filename
    6829848