Title :
Min-Sum-based decoders running on noisy hardware
Author :
Ngassa, Christiane Kameni ; Savin, Valentin ; Declercq, David
Author_Institution :
LETI, CEA, Grenoble, France
Abstract :
This paper deals with Low-Density Parity-Check decoders running on noisy hardware. This represents an unconventional paradigm in communication theory, since it is traditionally assumed that the error correction decoder operates on error-free devices and the randomness (in the form of noise and/or errors) exists only in the transmission channel. However, with the advent of nanoelectronics, it starts to be widely accepted that the future generations of circuits and systems will need to reliability compute and solve statistical inferences, by making use of unreliable “noisy” components. It is then critical to properly evaluate the robustness of the existing decoders in the presence of an additional source of noise at the circuit level. To this end, we first introduce a new error model approach and carry out the “noisy” density evolution analysis of the fixed-point Min-Sum decoding. Then, for different parameters of the noisy components of the decoder, we determine the range of the signal-to-noise ratio values for which the decoder is able to achieve a target bit error rate performance. Finally, we evaluate the finite-length performance of the Min-Sum and two other Min-Sum-based decoders running on noisy hardware.
Keywords :
block codes; codecs; error correction codes; error statistics; parity check codes; bit error rate performance; communication theory; error correction decoder; error model approach; error-free devices; finite-length performance; fixed-point min-sum decoding; low-density parity-check decoders; min-sum-based decoders; nanoelectronics; noisy density evolution analysis; noisy hardware; signal-to-noise ratio; statistical inferences; transmission channel; unreliable noisy components; Adders; Decoding; Hardware; Iterative decoding; Noise measurement; Probabilistic logic;
Conference_Titel :
Global Communications Conference (GLOBECOM), 2013 IEEE
Conference_Location :
Atlanta, GA
DOI :
10.1109/GLOCOM.2013.6831348