DocumentCode
688718
Title
Light scattering from silicon nitride microdisks
Author
McCloskey, D. ; Donegan, J.F.
Author_Institution
Sch. of Phys., Trinity Coll. Dublin, Dublin, Ireland
fYear
2013
fDate
9-14 June 2013
Firstpage
1
Lastpage
2
Abstract
High intensity sub-wavelength spots and low divergence nanojets are observed in a system of Si3N4 microdisks illuminated with linearly polarised coherent light of wavelength 532 nm. The disks are of height 400 nm with diameters ranging from 1μm to 10μm. Light scattered from the disk and substrate is observed by imaging from above. In free space light is focused inside the disks and a sub wavelength spot is observed. The angular distribution of the intensity compares well to numerical 3D FEM results. The diameter and polarisation dependence of the scattering is explored and matches well with theory.
Keywords
light polarisation; light scattering; silicon compounds; Si3N4; angular intensity distribution; diameter dependence; free space light; high intensity sub-wavelength spots; light scattering; linearly polarised coherent light; low divergence nanojets; polarisation dependence; silicon nitride microdisks; size 1 mum to 10 mum; substrate; wavelength 532 nm; Light scattering; Optical imaging; Optical scattering; Photonics; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6833093
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