• DocumentCode
    688718
  • Title

    Light scattering from silicon nitride microdisks

  • Author

    McCloskey, D. ; Donegan, J.F.

  • Author_Institution
    Sch. of Phys., Trinity Coll. Dublin, Dublin, Ireland
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    High intensity sub-wavelength spots and low divergence nanojets are observed in a system of Si3N4 microdisks illuminated with linearly polarised coherent light of wavelength 532 nm. The disks are of height 400 nm with diameters ranging from 1μm to 10μm. Light scattered from the disk and substrate is observed by imaging from above. In free space light is focused inside the disks and a sub wavelength spot is observed. The angular distribution of the intensity compares well to numerical 3D FEM results. The diameter and polarisation dependence of the scattering is explored and matches well with theory.
  • Keywords
    light polarisation; light scattering; silicon compounds; Si3N4; angular intensity distribution; diameter dependence; free space light; high intensity sub-wavelength spots; light scattering; linearly polarised coherent light; low divergence nanojets; polarisation dependence; silicon nitride microdisks; size 1 mum to 10 mum; substrate; wavelength 532 nm; Light scattering; Optical imaging; Optical scattering; Photonics; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6833093