DocumentCode :
688859
Title :
Investigation of photoexcited carrier responses in a solar cell with a dynamic terahertz emission microscope
Author :
Nakanishi, Hayao ; Ito, Akinori ; Takayama, K. ; Kawayama, Iwao ; Murakami, H. ; Tonouchi, Masayoshi
Author_Institution :
Dainippon Screen Manuf., Kyoto, Japan
fYear :
2013
fDate :
9-14 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
We applied a pump-probe laser terahertz emission microscope to investigate dynamic response of photoexited carriers in a solar cell. We could clearly observe the change of terahertz radiation at the grain boundary in the polycrystalline silicon solar cell using the pump-probe methods, which could not be obtained by simple terahertz emission imaging.
Keywords :
elemental semiconductors; grain boundaries; high-speed optical techniques; optical microscopy; photoexcitation; silicon; solar cells; terahertz spectroscopy; Si; dynamic response; dynamic terahertz emission microscope; grain boundary; photoexcited carrier responses; polycrystalline silicon solar cell; pump-probe laser terahertz emission microscope; Laser excitation; Microscopy; Photovoltaic cells; Probes; Pump lasers; Silicon; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6833236
Link To Document :
بازگشت