• DocumentCode
    688859
  • Title

    Investigation of photoexcited carrier responses in a solar cell with a dynamic terahertz emission microscope

  • Author

    Nakanishi, Hayao ; Ito, Akinori ; Takayama, K. ; Kawayama, Iwao ; Murakami, H. ; Tonouchi, Masayoshi

  • Author_Institution
    Dainippon Screen Manuf., Kyoto, Japan
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We applied a pump-probe laser terahertz emission microscope to investigate dynamic response of photoexited carriers in a solar cell. We could clearly observe the change of terahertz radiation at the grain boundary in the polycrystalline silicon solar cell using the pump-probe methods, which could not be obtained by simple terahertz emission imaging.
  • Keywords
    elemental semiconductors; grain boundaries; high-speed optical techniques; optical microscopy; photoexcitation; silicon; solar cells; terahertz spectroscopy; Si; dynamic response; dynamic terahertz emission microscope; grain boundary; photoexcited carrier responses; polycrystalline silicon solar cell; pump-probe laser terahertz emission microscope; Laser excitation; Microscopy; Photovoltaic cells; Probes; Pump lasers; Silicon; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6833236