• DocumentCode
    68915
  • Title

    External Electric Field Assisted Ultraviolet Irradiation for Bonding of Lubricant Film on Magnetic Disks

  • Author

    Tani, Hiroshi ; Sakane, Yasuo ; Koganezawa, Shinji ; Tagawa, Norio

  • Author_Institution
    Dept. of Mech. Eng., Kansai Univ., Suita, Japan
  • Volume
    50
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we sought to determine if, during ultraviolet (UV) exposure, the external electric field could control the bonded lubricant thickness. During UV irradiation, the effect of the external electric field on both the bonded lubricant thickness and surface free energy was studied. The lubricant films after UV irradiation were analyzed using time-of-flight secondary ion mass spectroscopy (TOF-SIMS). Because of the negative electric field, the polar component of the surface free energy was reduced, while the bonded lubricant thickness increased. Based on the results of the TOF-SIMS analysis, we concluded that these findings resulted from the negative electric field accelerating the photoelectron emission, and because of these photoelectrons, the bonding between the end groups and diamond-like carbon surface increased.
  • Keywords
    bonding processes; diamond-like carbon; liquid films; lubricants; photoelectron spectra; secondary ion mass spectra; surface energy; time of flight mass spectra; ultraviolet radiation effects; C; TOF-SIMS analysis; UV irradiation; bonding; diamond-like carbon surface; external electric field assisted ultraviolet irradiation; lubricant film; magnetic disks; photoelectron emission; surface free energy; time-of-flight secondary ion mass spectroscopy; ultraviolet exposure; Acceleration; Bonding; Electrodes; Lubricants; Radiation effects; Surface treatment; Temperature measurement; Head-disk interface; magnetic disk; photoelectron emission; ultraviolet (UV);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2014.2318015
  • Filename
    6971404