Title :
Measurement of the third order intercept point for a photodiode using two maximum-biased MZM
Author :
Shangyuan Li ; Xiaoping Zheng ; Hanyi Zhang ; Bingkun Zhou
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
We proposed a simple method to measure the third-order intercept point for a photodiode using two-tone and two maximum-biased MZM. The measured IP3 of 16.04dBm agreed with that measured using traditional three-tone setup.
Keywords :
Mach-Zehnder interferometers; nonlinear optical susceptibility; optical modulation; optical variables measurement; photodiodes; IP3; maximum-biased MZM; photodiode; third order intercept point measurement; traditional three-tone setup; two-tone MZM; Frequency measurement; Microwave measurement; Optical fiber communication; Optical variables measurement; Photodiodes; Pollution measurement; Proposals;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
