Title :
Dispersion of the electronic third-order nonlinearity of symmetric molecules
Author :
Honghua Hu ; Ensley, Trenton R. ; Seidel, Mike ; Ferdinandus, Manuel R. ; Reichert, Matthew ; Przhonska, Olga V. ; Hagan, David J. ; Van Stryland, Eric W.
Author_Institution :
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
Using a dual-arm Z-scan to increase the signal-to-noise, we measure the dispersion of the electronic third-order nonlinearity of symmetric polymethines and squaraines and find good agreement with the essential-state model including CS2.
Keywords :
nonlinear optics; optical dispersion; optical noise; organic compounds; dual-arm Z-scan; electronic third-order nonlinearity dispersion; signal-to-noise ratio; symmetric molecules; symmetric polymethines; symmetric squaraines; Dispersion; Educational institutions; Fitting; Optimized production technology; Photonics; Physics; Solvents;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
