DocumentCode :
690108
Title :
Examining nanoscale photovoltaics with high brightness Fourier transform measurements
Author :
Sfeir, Matthew Y. ; Camino, Fernando E. ; Chang-Yong Nam ; Black, Charles T.
Author_Institution :
Center for Functional Nanomater., Brookhaven Nat. Lab., Upton, NY, USA
fYear :
2013
fDate :
9-14 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
We describe a new Facility effort utilizing high brightness Fourier transform methods, including measurements of transmission, reflection, and photoconductivity spectra, to characterize nanomaterial-based model photovoltaic devices.
Keywords :
Fourier transform spectra; brightness; nanostructured materials; photoconductivity; solar cells; high brightness Fourier transform measurements; nanoscale photovoltaics; photoconductivity; reflection spectra; transmission spectra; Fourier transforms; Metals; Optical device fabrication; Optical surface waves; Optical variables measurement; Photoconductivity; Plasmons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6834500
Link To Document :
بازگشت