Title :
Measurement Techniques for RF Nanoelectronics [From the Guest Editors´ Desk]
Author :
Wallis, T. Mitch ; Pierantoni, Luca
Abstract :
The articles in this special section focus on measurement techniques for radio frequency nanoelectronic devices.
Keywords :
Microwave imaging; Microwave measurement; Microwave transistors; Nanoelectronics; Radio frequency; Special issues and sections;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2013.2292758
