DocumentCode :
69054
Title :
IEEE International Integrated Reliability Workshop (IIRW)
Volume :
34
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
821
Lastpage :
821
Abstract :
Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2264039
Filename :
6517570
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=69054