DocumentCode :
690964
Title :
Ways to Improve Temperature Measurement Accuracy of InfraScope Thermal Mapper
Author :
Zhai Yuwei ; Liang Faguo ; Zheng Shiqi ; Wu Aihua ; Qiao Yue
Author_Institution :
Metrol. Center, Hebei Semicond. Res. Inst., Shijiazhuang, China
fYear :
2013
fDate :
21-23 Sept. 2013
Firstpage :
10
Lastpage :
13
Abstract :
In this paper we discuss the ways to improve the accuracy of InfraScope Thermal Mapper. We demonstrate the theory about space resolution and how it influences the temperature measurement using InfraScope Thermal Mapper. Then a way to enhance the accuracy by choosing the space resolution adequately is presented. Some experiments are designed and the results prove the way is effective. Then we study on the basic structures and work procedures of this instrument, combining with theory analysis we conclude an efficient emissivity measurement method. Following which we can measure emissivity at a single temperature. Then we analyze errors brought in by this method in emissivity calculation procedure, deliberately propose ways to improve on the measurement accuracy. At last, we verify the improvement by precise experiments.
Keywords :
emissivity; temperature measurement; emissivity calculation procedure; emissivity measurement method; infrascope thermal mapper; space resolution; temperature measurement; Accuracy; Aerospace electronics; Instruments; Metals; Photonics; Semiconductor device measurement; Temperature measurement; InfraScope Thermal Mapper; accuracy; emissivity; error; space resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2013 Third International Conference on
Conference_Location :
Shenyang
Type :
conf
DOI :
10.1109/IMCCC.2013.10
Filename :
6840399
Link To Document :
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