DocumentCode
690964
Title
Ways to Improve Temperature Measurement Accuracy of InfraScope Thermal Mapper
Author
Zhai Yuwei ; Liang Faguo ; Zheng Shiqi ; Wu Aihua ; Qiao Yue
Author_Institution
Metrol. Center, Hebei Semicond. Res. Inst., Shijiazhuang, China
fYear
2013
fDate
21-23 Sept. 2013
Firstpage
10
Lastpage
13
Abstract
In this paper we discuss the ways to improve the accuracy of InfraScope Thermal Mapper. We demonstrate the theory about space resolution and how it influences the temperature measurement using InfraScope Thermal Mapper. Then a way to enhance the accuracy by choosing the space resolution adequately is presented. Some experiments are designed and the results prove the way is effective. Then we study on the basic structures and work procedures of this instrument, combining with theory analysis we conclude an efficient emissivity measurement method. Following which we can measure emissivity at a single temperature. Then we analyze errors brought in by this method in emissivity calculation procedure, deliberately propose ways to improve on the measurement accuracy. At last, we verify the improvement by precise experiments.
Keywords
emissivity; temperature measurement; emissivity calculation procedure; emissivity measurement method; infrascope thermal mapper; space resolution; temperature measurement; Accuracy; Aerospace electronics; Instruments; Metals; Photonics; Semiconductor device measurement; Temperature measurement; InfraScope Thermal Mapper; accuracy; emissivity; error; space resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2013 Third International Conference on
Conference_Location
Shenyang
Type
conf
DOI
10.1109/IMCCC.2013.10
Filename
6840399
Link To Document