Title :
Hartmann-Shack Wavefront Detector Performance Numerical Simulation Analysis
Author :
Wen-Bo Jing ; Jin-rui Gan ; Qiang Chen ; Xiao-man Wang ; Hui-lin Jiang
Author_Institution :
Sch. of Photoelectric Eng., Changchun Univ. of Sci. & Technol., Changchun, China
Abstract :
Micro lens array whose parameters directly affect the wave front detection performance is a core component of Hartmann-Shack wave front sensor. Make a deep theoretical study on sensitivity, spatial resolution, wave front measurement error and Dynamic Range which affect the design of the wave front detector, and research the coupling relationship between micro lens array parameters and focal length by numerical simulation analyzing method. Experimental results showed that: Hartmann-Shack´ various parameters are all determined by the number of sub-lenses and the focal length of the micro lens array. Dynamic range and sensitivity are in reciprocal relationship with the focal length, the full dynamic range of the pore size became negative when the focal length increased to a certain threshold, the wave front measuring error can be reduced by higher Fresnel number, greater micro lenses number and lesser number of Zernike polynomial. It is of great significance for multiple sub-aperture detection technique to select reasonable parameters of sensor in the practical application.
Keywords :
Zernike polynomials; measurement errors; microlenses; optical arrays; optical design techniques; wavefront sensors; Fresnel number; Hartmann-Shack wavefront detector performance; Hartmann-Shack wavefront sensor; Zernike polynomial; dynamic range; focal length; microlens array; multiple subaperture detection technique; numerical simulation analysis; pore size; sensitivity; spatial resolution; sublenses; wavefront detection; wavefront detector design; wavefront measurement error; Arrays; Detectors; Dynamic range; Laser beams; Lenses; Microoptics; Sensitivity; Hartmann-Shack method; microlens array; parametric analysis; wavefront detector;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2013 Third International Conference on
Conference_Location :
Shenyang
DOI :
10.1109/IMCCC.2013.219