DocumentCode :
691269
Title :
Contour Matching Based on Local Curvature Scale
Author :
Zhao Yan ; Xu Gui-li ; Tian Yu-peng ; Guo Rui-peng ; Wang Biao ; Li Kai-yu
Author_Institution :
Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
fYear :
2013
fDate :
21-23 Sept. 2013
Firstpage :
1702
Lastpage :
1707
Abstract :
Image matching based on contour is an important issue in computer vision, navigation and pattern recognition. The image matching methods like curvature-based methods and corner-based methods have poor robustness to the contour´s noise and distortion, and some matching methods are applied only to closed contours. A novel contour representation and matching algorithm, based on local curvature scale, is proposed in this paper. First, build each point´s c-scale segment and calculate the curvature of contour points. Then, the invariant characteristic curve is established based on curvature integral, which is invariant to RST (rotation, scale and translation). Finally, the matching points of contours are captured by measuring the similarity of invariant characteristic curves. Experimental results show that this method can achieve better performance than previous methods. Also it fits for the matching between two closed contours, two open curves and the matching between an open contour and a part of closed contour. The proposed method reduces the impact of noise and scale variation effectively, and it has better robustness to rotation, scale and translation of contour.
Keywords :
edge detection; image matching; image representation; RST; c-scale segment; computer vision; contour matching; contour noise; contour representation; corner-based methods; curvature-based methods; image matching; image matching methods; local curvature scale; pattern recognition; rotation scale and translation; Correlation; Educational institutions; Image matching; Kernel; Noise; Robustness; Shape; contour matching; contour representation; image matching; local curvature scale;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2013 Third International Conference on
Conference_Location :
Shenyang
Type :
conf
DOI :
10.1109/IMCCC.2013.376
Filename :
6840766
Link To Document :
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