DocumentCode
691395
Title
Exploring ultra low noise semiconductor devices
Author
Leitch, James
Author_Institution
Inst. of Phys., London, UK
fYear
2013
fDate
29-29 Oct. 2013
Firstpage
29
Lastpage
32
Abstract
The simulation of a new proposed active device structure shows a significant reduction in the thermal and shot noise levels, when used as an amplifier, giving an uncooled Te of the order 1oK. A mono-isotype pp+junction (MIJ) is used to form an isotype region within an anisotype device structure.
Keywords
semiconductor device noise; shot noise; thermal noise; active device structure; amplifiers; shot noise; thermal noise; ultra low noise semiconductor devices;
fLanguage
English
Publisher
iet
Conference_Titel
Active and Passive RF Devices Seminar, 1st Annual
Conference_Location
Glasgow
Electronic_ISBN
978-1-84919-793-9
Type
conf
DOI
10.1049/ic.2013.0243
Filename
6842466
Link To Document