• DocumentCode
    692162
  • Title

    New insights into redox based resistive switches

  • Author

    Tappertzhofen, S. ; Waser, Rainer ; Valov, I.

  • Author_Institution
    Inst. fur Werkstoffe der Elektrotech. II, RWTH Aachen Univ., Aachen, Germany
  • fYear
    2013
  • fDate
    12-14 Aug. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Resistive Switching Memories (RRAM) are one of the most promising candidates for future memory devices. Among other emerging RRAM concepts redox based resistive switches (ReRAM) attracted high attention to replace conventional FLASH technology. Here we show both on experimental and theoretical level new insights into nanoionic resistive switches. Of particular interest are recently discovered non equilibrium states and their potential impact on the device behavior. The strong non linear switching kinetics and redox reactions prior to the switching event in cation based memory cells will be further discussed. Moreover, the effect of quantized resistance values is shown in respect to the ultimate scalability of ReRAMs.
  • Keywords
    metallisation; oxidation; random-access storage; reduction (chemical); switches; ReRAMs; nanoionic resistive switches; nonlinear switching kinetics; redox based resistive switches; redox reactions; resistive switching memories; Electrodes; Kinetic theory; Materials; Nanoscale devices; Radiation detectors; Resistance; Switches; Non Equilibrium States; Quantum Conductance; Redox Reactions; Switching Kinetics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2013 13th
  • Conference_Location
    Minneapolis, MN
  • Type

    conf

  • DOI
    10.1109/NVMTS.2013.6851054
  • Filename
    6851054