Validation of Power Linearity in Terahertz Time-Domain Spectroscopy Using a Programmable Step Attenuator

Author

Iida, Hiroyuki ; Kinoshita, Moto ; Shimada, Yusuke ; Kuroda, Hideo ; Kitagishi, Keiko ; Izutani, Y.

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1801

Lastpage

1806

Abstract

We have constructed a programmable terahertz step attenuator by stacking metallized-film attenuators (MFAs) of different transmittances. Sputter deposition of Inconel alloy on thin polyester films is used to fabricate the MFAs. Good repeatability and flatness of the step attenuator are confirmed in transmittance measurements by a terahertz time-domain spectroscopy (THz-TDS) system. A method to evaluate the linearity of the THz-TDS system is proposed by using the step attenuator over a wide dynamic range. Calibration curves are analyzed by measuring the transmittance of maltose in different concentrations, and the validity of the proposed method is discussed.

Keywords

attenuators; calibration; terahertz spectroscopy; calibration curves; inconel alloy; metallized-film attenuators; power linearity; programmable terahertz step attenuator; repeatability; sputter deposition; terahertz time-domain spectroscopy; transmittance measurements; validation; wide dynamic range; Attenuation; Attenuation measurement; Attenuators; Calibration; Dynamic range; Linearity; Metals; Calibration curve; linearity; maltose; metallized film; programmable step attenuator; terahertz time-domain spectroscopy (THz-TDS); validation;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2012.2225927

Filename

6353925