Title :
FlockLab: A testbed for distributed, synchronized tracing and profiling of wireless embedded systems
Author :
Lim, Robert ; Ferrari, Federico ; Zimmerling, Marco ; Walser, Christoph ; Sommer, P. ; Beutel, Jan
Author_Institution :
Comput. Eng. & Networks Lab., ETH Zurich, Zurich, Switzerland
Abstract :
Testbeds are indispensable for debugging and evaluating wireless embedded systems. While existing testbeds provide ample opportunities for realistic, large-scale experiments, they are limited in their ability to closely observe and control the distributed operation of resource-constrained nodes-access to the nodes is restricted to the serial port. This paper presents FlockLab, a testbed that overcomes this limitation by allowing multiple services to run simultaneously and synchronously against all nodes under test in addition to the traditional serial port service: tracing of GPIO pins to record logical events occurring on a node, actuation of GPIO pins to trigger actions on a node, and high-resolution power profiling. FlockLab´s accurate timing information in the low microsecond range enables logical events to be correlated with power samples, thus providing a previously unattained level of visibility into the distributed behavior of wireless embedded systems. In this paper, we describe FlockLab´s design, benchmark its performance, and demonstrate its capabilities through several real-world test cases.
Keywords :
constraint theory; embedded systems; peripheral interfaces; program debugging; program diagnostics; resource allocation; telecommunication power supplies; timing; wireless sensor networks; FlockLab; GPIO pins tracing; distributed behavior; distributed tracing; logical event recording; power profiling; resource constrained node; serial port service; synchronised tracing; timing information; trigger actions; wireless embedded system debugging; wireless embedded system evaluation; wireless embedded system profiling; Accuracy; Observers; Pins; Power measurement; Servers; Synchronization; GPIO actuation; GPIO tracing; Testbed; adjustable power supply; power profiling; wireless sensor network;
Conference_Titel :
Information Processing in Sensor Networks (IPSN), 2013 ACM/IEEE International Conference on
Conference_Location :
Philadelphia, PA
DOI :
10.1109/IPSN.2013.6917582