DocumentCode :
693598
Title :
Optical nonlinearities in Se85−xTe15Bix thin films
Author :
Sharma, Ashok ; Yadav, Parmatma ; Anshu, Kumari
Author_Institution :
Dept. of Appl. Sci. & Humanities, ITM Univ., Gurgaon, India
fYear :
2013
fDate :
17-18 Dec. 2013
Firstpage :
1
Lastpage :
2
Abstract :
Present work reports the nonlinear refractive index of Se85-xTe15Bix thin films which depends upon linear refractive index. Increase in nonlinear refractive index is attributed to increased polarizability due to larger Bi radii.
Keywords :
bismuth compounds; chalcogenide glasses; light polarisation; nonlinear optics; refractive index; selenium compounds; semiconductor thin films; tellurium compounds; Bi radii; Se85-xTe15Bix; nonlinear refractive index; optical nonlinearities; polarizability; thin films; Atom optics; Atomic measurements; Glass; Nonlinear optics; Optical films; Optical polarization; Optical refraction; Chalcogenide Glass; Density; Linear and nonlinear refractive index; Susceptiblity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Recent Advances in Photonics (WRAP), 2013 Workshop on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4799-4864-2
Type :
conf
DOI :
10.1109/WRAP.2013.6917690
Filename :
6917690
Link To Document :
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