Accelerated life tests for data acquisition devices used in smart grids

The data acquisition devices play an important role in modern Advanced Metering Infrastructure and smart grid energy systems. Accelerated life tests are used to obtain the failure data of the device in a timely faction. In order to analyze the data, we develop a statistical inference procedure to analyze ALT data with multiple stress factors and multiple failure modes. This procedure is likelihood-based. We then apply the procedure to analyze the ALT data of the device, which has two stress factors and two failure modes. Based on the analysis, the failure time distribution under normal use conditions can be effectively estimated.