• DocumentCode
    694206
  • Title

    A new method for metrology monitor charts´ spec limit setting

  • Author

    Ma, Jinyi Jenny ; Cao, Yan Kaily ; Chien, Weiting Kary

  • Author_Institution
    Corp. Q&R Center, Semicond. Manuf. Int. Corp., Shanghai, China
  • fYear
    2013
  • fDate
    10-13 Dec. 2013
  • Firstpage
    1166
  • Lastpage
    1169
  • Abstract
    In this paper, a new method to set the spec (specification) limits for measurement data from metrology tools is introduced. Combining the accuracy spec guaranteed by metrology vendors, the metrology tool´s actual performance, and the inline measurement requirement according to MSA (Measurement System Analysis) spirit, we´ve not only studied the proper method but also standardized the control flow to define the spec limits. Through such categorization and characterization, we can identify different situations to set the proper spec limits. This method can be applied as one of the release criteria for new metrology tools at the certification stage, and be further applied as one of the routine review flow for tool performance checking.
  • Keywords
    control charts; measurement systems; MSA; certification stage; inline measurement requirement; measurement system analysis; metrology monitor charts specification limit setting; metrology tools; metrology vendors; tool performance checking; Accuracy; Fluid flow measurement; Indexes; Market research; Metrology; Monitoring; Semiconductor device measurement; MSA; Metrology Tool; Spec Limit Setting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Type

    conf

  • DOI
    10.1109/IEEM.2013.6962594
  • Filename
    6962594