DocumentCode :
694206
Title :
A new method for metrology monitor charts´ spec limit setting
Author :
Ma, Jinyi Jenny ; Cao, Yan Kaily ; Chien, Weiting Kary
Author_Institution :
Corp. Q&R Center, Semicond. Manuf. Int. Corp., Shanghai, China
fYear :
2013
fDate :
10-13 Dec. 2013
Firstpage :
1166
Lastpage :
1169
Abstract :
In this paper, a new method to set the spec (specification) limits for measurement data from metrology tools is introduced. Combining the accuracy spec guaranteed by metrology vendors, the metrology tool´s actual performance, and the inline measurement requirement according to MSA (Measurement System Analysis) spirit, we´ve not only studied the proper method but also standardized the control flow to define the spec limits. Through such categorization and characterization, we can identify different situations to set the proper spec limits. This method can be applied as one of the release criteria for new metrology tools at the certification stage, and be further applied as one of the routine review flow for tool performance checking.
Keywords :
control charts; measurement systems; MSA; certification stage; inline measurement requirement; measurement system analysis; metrology monitor charts specification limit setting; metrology tools; metrology vendors; tool performance checking; Accuracy; Fluid flow measurement; Indexes; Market research; Metrology; Monitoring; Semiconductor device measurement; MSA; Metrology Tool; Spec Limit Setting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on
Conference_Location :
Bangkok
Type :
conf
DOI :
10.1109/IEEM.2013.6962594
Filename :
6962594
Link To Document :
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