Title :
The quality control application for abnormal raw material early detection
Author :
Guan, Violet Shang ; July Shui ; Chang, Kuo-Pin
Author_Institution :
Dept. of Mater. Quality Eng., SMIC, Shanghai, China
Abstract :
Raw material quality control is one of the most important subjects for foundry manufacturing process with the advancing of semiconductor technology into nanometer nodes. Therefore, how to effectively detect abnormality at the early stage of raw material incoming or even at supplier sites become one more challenge topic. The successful early detection can reduce foundry manufacturing risk and cost. This paper will focus on the application of quality control method on both suppliers and foundry. The purpose is to reduce foundry manufacturing risk by implementing the best quality control methodology on raw material manufacturing process at supplier site and the early detection of nonconformance in raw material incoming inspection stage at foundry site.
Keywords :
cost reduction; foundries; inspection; quality control; raw materials; semiconductor technology; abnormal raw material early detection; foundry manufacturing cost reduction; foundry manufacturing process; foundry manufacturing risk reduction; nanometer nodes; quality control application; raw material incoming inspection stage; raw material manufacturing process; raw material quality control; semiconductor technology; supplier sites; Inspection; Manufacturing processes; Process control; Quality control; Raw materials; Raw material; abnormal early detection; quality control;
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on
Conference_Location :
Bangkok
DOI :
10.1109/IEEM.2013.6962597