DocumentCode
694209
Title
The quality control application for abnormal raw material early detection
Author
Guan, Violet Shang ; July Shui ; Chang, Kuo-Pin
Author_Institution
Dept. of Mater. Quality Eng., SMIC, Shanghai, China
fYear
2013
fDate
10-13 Dec. 2013
Firstpage
1179
Lastpage
1183
Abstract
Raw material quality control is one of the most important subjects for foundry manufacturing process with the advancing of semiconductor technology into nanometer nodes. Therefore, how to effectively detect abnormality at the early stage of raw material incoming or even at supplier sites become one more challenge topic. The successful early detection can reduce foundry manufacturing risk and cost. This paper will focus on the application of quality control method on both suppliers and foundry. The purpose is to reduce foundry manufacturing risk by implementing the best quality control methodology on raw material manufacturing process at supplier site and the early detection of nonconformance in raw material incoming inspection stage at foundry site.
Keywords
cost reduction; foundries; inspection; quality control; raw materials; semiconductor technology; abnormal raw material early detection; foundry manufacturing cost reduction; foundry manufacturing process; foundry manufacturing risk reduction; nanometer nodes; quality control application; raw material incoming inspection stage; raw material manufacturing process; raw material quality control; semiconductor technology; supplier sites; Inspection; Manufacturing processes; Process control; Quality control; Raw materials; Raw material; abnormal early detection; quality control;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on
Conference_Location
Bangkok
Type
conf
DOI
10.1109/IEEM.2013.6962597
Filename
6962597
Link To Document