• DocumentCode
    694209
  • Title

    The quality control application for abnormal raw material early detection

  • Author

    Guan, Violet Shang ; July Shui ; Chang, Kuo-Pin

  • Author_Institution
    Dept. of Mater. Quality Eng., SMIC, Shanghai, China
  • fYear
    2013
  • fDate
    10-13 Dec. 2013
  • Firstpage
    1179
  • Lastpage
    1183
  • Abstract
    Raw material quality control is one of the most important subjects for foundry manufacturing process with the advancing of semiconductor technology into nanometer nodes. Therefore, how to effectively detect abnormality at the early stage of raw material incoming or even at supplier sites become one more challenge topic. The successful early detection can reduce foundry manufacturing risk and cost. This paper will focus on the application of quality control method on both suppliers and foundry. The purpose is to reduce foundry manufacturing risk by implementing the best quality control methodology on raw material manufacturing process at supplier site and the early detection of nonconformance in raw material incoming inspection stage at foundry site.
  • Keywords
    cost reduction; foundries; inspection; quality control; raw materials; semiconductor technology; abnormal raw material early detection; foundry manufacturing cost reduction; foundry manufacturing process; foundry manufacturing risk reduction; nanometer nodes; quality control application; raw material incoming inspection stage; raw material manufacturing process; raw material quality control; semiconductor technology; supplier sites; Inspection; Manufacturing processes; Process control; Quality control; Raw materials; Raw material; abnormal early detection; quality control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Type

    conf

  • DOI
    10.1109/IEEM.2013.6962597
  • Filename
    6962597