Title :
The Reliability Analysis of Embedded Systems
Author_Institution :
Shanghai Univ. of Eng. Sci., Shanghai, China
Abstract :
This article starts with the introduction of the essence of the reliability of embedded system. By introducing some characteristics of embedded system such as failure rate, reliability and mean time to failure to analyze the reliability of embedded system, and set up the model of a single system, series system and parallel system. The models founded were simulated with Simulink software. Finally, the results of the simulation and the example validations indicate that series-parallel hybrid structure is very necessary in order to improve the reliability of embedded system and make the system has a long service life.
Keywords :
embedded systems; software reliability; embedded systems; parallel system; series system; series-parallel hybrid structure; single system; software reliability; Density functional theory; Embedded systems; Hardware; Reliability engineering; Software reliability; Embedded system; Failure rate; Mean time to failure; Model; Reliability; Structure; The reliability function;
Conference_Titel :
Information Science and Cloud Computing Companion (ISCC-C), 2013 International Conference on
Conference_Location :
Guangzhou
DOI :
10.1109/ISCC-C.2013.142
