Higher Copper Composition Shear Stress Analysis on Lead Free Solder Ball

Author

Retnasamy, Vithyacharan ; Sauli, Zaliman ; Ehkan, P. ; Taniselass, Steven

Author_Institution

Sch. of Microelectron. Eng., Univ. Malaysia Perlis (UniMAP), Pauh Putra Perlis, Malaysia

fYear

2013

fDate

10-13 Sept. 2013

Firstpage

198

Lastpage

201

Abstract

The reliability performance and structural of the solder joint on the Ball Grid Array (BGA) has become an important concern, due to increasing demand of electronic devices. The reliability of the BGA are evaluated through shear test. Different parameters of the ball shear test will cause the change on stress and strain. In this paper, a simple shear test on a single solder ball joints on Ball Grid Array (BGA) with varied shear speed was simulated. Lead free solder Sn-3.5Ag-0.7Cu is used in this analysis. Simple Single Factor (SSF) experiment for a single factor was used to analyse the load effect on a single solder ball. Simulation of load effects on BGA was accomplished by using ANSYS Version 11. The results in load effect on the single solder joint of BGA was plotted. Result shows that the high shear speed test obtains greater shear forces compare to low shear speed test.

Keywords

ball grid arrays; electronics industry; mechanical engineering computing; reliability; shear strength; solders; statistical analysis; stress-strain relations; ANSYS Version 11; BGA; ball grid array; ball shear test; copper; lead free solder ball; load effect; reliability; shear stress analysis; simple single factor; solder ball joints; stress -strain; Analytical models; Computational modeling; Plastics; Soldering; Strain; Stress; Lead free solder alloy; shear test; single solder joint;

fLanguage

English

Publisher

ieee

Conference_Titel

Modelling and Simulation (EUROSIM), 2013 8th EUROSIM Congress on

Conference_Location

Cardiff

Type

conf

DOI

10.1109/EUROSIM.2013.45

Filename

7004943