• DocumentCode
    69714
  • Title

    Ballistic Transport Performance of Silicane and Germanane Transistors

  • Author

    Kain Lu Low ; Wen Huang ; Yee-Chia Yeo ; Gengchiau Liang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1590
  • Lastpage
    1598
  • Abstract
    The ballistic transport performance of field-effect transistor (FET) based on hydrogenated silicene and germanene, i.e., silicane and germanane, respectively, is examined. The electronic band structures of silicane and germanane are investigated using the first-principles density functional theory. Subsequently, the ballistic performance of FETs is evaluated via the semiclassical ballistic transport model. We find that silicane n-MOSFET offers a relatively better ON-current performance than transistors made of germanane and 2-D transition metal dichalcogenides (2-D-TMDs) (MoS2, MoSe2, WS2, and WSe2). Germanane n-MOSFET suffers from the issue of low density of states due to its smaller electron effective mass. P-FETs based on germanane and silicane have higher ON-current than those of 2-D-TMDs p-FETs. Further investigation on other aspects of silicane and germanane MOSFETs, such as gate leakage and contact resistance, is needed to comprehensively assess their overall performance metrics.
  • Keywords
    ballistic transport; contact resistance; density functional theory; field effect transistors; semiconductor device models; 2D transition metal dichalcogenides; contact resistance; density functional theory; electronic band structures; field effect transistor; gate leakage; germanane n-MOSFET; semiclassical ballistic transport model; silicane n-MOSFET; Ballistic transport; Effective mass; MOSFET; Materials; Performance evaluation; Photonic band gap; Ballistic transport; germanane; hydrogenated silicene and germanane; silicane; silicane.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2313065
  • Filename
    6784483