Title :
CDM Tester Properties as Deduced From Waveforms
Author :
Maloney, Timothy J. ; Jack, Nathan
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Two-pole resistance-inductance-capacitance (RLC) models, matching peak current and charge under the first current peak, are shown to fit charged device model (CDM) waveforms well, as they target features that cause device failure. The effect of oscilloscope filtering on the waveform can also be assessed. RLC properties of ferrites, air sparks, varying dielectric, and other tester elements become clear and point us to a revised CDM test standard.
Keywords :
RLC circuits; ferrites; test equipment; CDM tester properties; RLC models; air sparks; charged device model waveforms; ferrites; oscilloscope filtering; two-pole resistance-inductance-capacitance models; varying dielectric; Dielectrics; Electronics packaging; Integrated circuit modeling; Market research; Oscilloscopes; Sparks; Standards; Electrostatic discharge (ESD); Laplace transforms; charged device model (CDM); circuit models; oscilloscope modeling; step response;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2014.2316177
