DocumentCode :
698970
Title :
Debug Challenges for UTMI Low Pin Interface (ULPI) PHY in Nano Scale Technology
Author :
Pandey, Maneesh Kumar ; Jain, Neeraj ; Shekhar, Shwetank ; Kumar, Amresh
Author_Institution :
Digital Networking Group, Freescale Semicond. India Private Ltd., Noida, India
fYear :
2015
fDate :
13-14 Feb. 2015
Firstpage :
330
Lastpage :
333
Abstract :
Real world communication are analog in nature whereas data processing happens in digital domain. This leads to generation of Mixed Signal design. With reference to USB, ULPI PHY serves as mixed design component that is present in most of today´s gadgets. Because of its high speed and complexity, there is a need to check the individual design features of the ULPI PHY IP, which are hard to validate when the embedded in a System on Chip. The limitation comes from the fact that only a limited number of signals can be probed at SOC level. This paper describes the debug challenges and techniques used to validate these features before the IP goes into SOC.
Keywords :
IP networks; nanoelectronics; system-on-chip; ULPI PHY IP; UTMI PHY low pin interface; nanoscale technology; system on chip; Conferences; Debugging; Receivers; Sensitivity; System-on-chip; Testing; Universal Serial Bus; Low Pin Interface; ULPI; USB; UTMI; nano scale;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence & Communication Technology (CICT), 2015 IEEE International Conference on
Conference_Location :
Ghaziabad
Print_ISBN :
978-1-4799-6022-4
Type :
conf
DOI :
10.1109/CICT.2015.83
Filename :
7078720
Link To Document :
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