• DocumentCode
    702035
  • Title

    Bayesian network for fault diagnosis

  • Author

    Lo, C.H. ; Wong, Y.K. ; Rad, A.B.

  • Author_Institution
    Department of Electrical Engineering, The Hong Kong Polytechnic University Hung Hom, Kowloon, Hong Kong
  • fYear
    2003
  • fDate
    1-4 Sept. 2003
  • Firstpage
    1381
  • Lastpage
    1386
  • Abstract
    Fault diagnosis based on artificial intelligence techniques often deals with uncertain knowledge and incomplete input data. Probability reasoning is a method to deal with uncertain information, and Bayesian network is a tool that brings it into the real world applications. This paper describes the application of Bayesian network for diagnosing faulty components from engineered systems. A general procedure for constructing the Bayesian network structure on the basis of a bond graph model is proposed. We demonstrate how the resulting Bayesian network can be applied to fault diagnosis in an engineered system.
  • Keywords
    Bayes methods; Cognition; Computational modeling; Fault diagnosis; Liquids; Mathematical model; Probability distribution; Bayesian networks; Bond graph; Model-based fault diagnosis; Probability reasoning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Control Conference (ECC), 2003
  • Conference_Location
    Cambridge, UK
  • Print_ISBN
    978-3-9524173-7-9
  • Type

    conf

  • Filename
    7085154