• DocumentCode
    702275
  • Title

    Temperature aware refresh for DRAM performance improvement in 3D ICs

  • Author

    Menglong Guan ; Lei Wang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    207
  • Lastpage
    211
  • Abstract
    Three-dimensional (3D) integration allows IC designs to stack DRAM directly on the top of execution units, which greatly reduces DRAM access latency and optimizes energy consumption. Unfortunately, the heat generated by the processor unit cannot be effectively dissipated. As a result, DRAM operation temperature is undesirably increased. Due to the fact that 3D stacked DRAM operates under a severe thermal condition, conventional designs based on the peak temperature lead to a high refresh rate, which introduces large performance penalty in 3D stacked DRAM. To address this problem, we propose the Temperature Aware Refresh (TAR) technique for 3D stacked DRAM. The goal is to mitigate this performance penalty by adjusting the refresh rates of DRAM banks based on the actual thermal conditions at their locations. As a result, only banks that work in the peak temperature refresh frequently, and the rest of banks can be refreshed at a lower rate. This enables more read and write accesses which improvements the overall system performance.
  • Keywords
    DRAM chips; integrated circuit design; three-dimensional integrated circuits; 3D integration; 3D stacked DRAM; DRAM access latency; DRAM operation temperature; IC designs; TAR technique; energy consumption; execution units; peak temperature; refresh rates; temperature aware refresh technique; thermal conditions; three-dimensional integration; Radiation detectors; Random access memory; Registers; Temperature control; Temperature distribution; Temperature sensors; Three-dimensional displays; 3D ICs; 3D Stacked DRAM; DRAM refresh; Temperature aware refresh policy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085426
  • Filename
    7085426