DocumentCode :
702300
Title :
Optimum domain partitioning to increase functional verification coverage
Author :
Mani Paret, Jomu George ; Mohamed, Otmane Ait
Author_Institution :
ECE Dept., Concordia Univ., Montreal, QC, Canada
fYear :
2015
fDate :
2-4 March 2015
Firstpage :
419
Lastpage :
423
Abstract :
Constrained Random Verification (CRV) is becoming the mainstream methodology for the functional verification of complex System on Chip (SoC) designs. In CRV, constraint satisfaction problem (CSP) solvers are used to generate the input stimulus required for verification. In order to achieve the verification closure, CRV tools have to produce multiple different solutions, distributed uniformly in the search space. One way to achieve even distribution of solutions is to divide the search space into several clusters and generate solutions from each cluster. Present day partitioning techniques treat the number of cluster as an input which must be given in advance. In this paper, we propose a method for estimating this parameter. The experimental results show that the proposed method helps to find the number of cluster accurately in a very short time.
Keywords :
constraint satisfaction problems; integrated circuit design; system-on-chip; complex system on chip; constrained random verification; constraint satisfaction problem solvers; functional verification coverage; optimum domain partitioning; Clustering algorithms; Cost function; Generators; Shape; Spatial databases; System-on-chip; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
Type :
conf
DOI :
10.1109/ISQED.2015.7085462
Filename :
7085462
Link To Document :
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