• DocumentCode
    703797
  • Title

    Clock domain crossing aware sequential clock gating

  • Author

    Jianfeng Liu ; Mi-Suk Hong ; Kyungtae Do ; Jung Yun Choi ; Jaehong Park ; Kumar, Mohit ; Kumar, Manish ; Tripathi, Nikhil ; Ranjan, Abhishek

  • Author_Institution
    S. LSI, Samsung Electron. Co. Ltd., Hwaseong, South Korea
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Power has become the overriding concern for most modern electronic applications today. To reduce clock power, which is a significant portion of the dynamic power consumed by a design, sequential clock gating is increasingly getting used over and above combinational clock gating. With the shrinking device sizes and increasingly complex designs, data is frequently transferred from one clock domain to the other. The sequential clock gating optimizations can use signals from across sequential boundaries and thus, can introduce new clock domain crossing (CDC) violations which can cause catastrophic functional issues in the fabricated chip. Hence, it has become very important that sequential clock gating optimizations be CDC aware. In this paper, we present an algorithm to handle CDC violations as part of the objective function for sequential clock gating optimizations. With the proposed algorithm, we have obtained an average of 22% sequential power savings - this is within 3% of the power savings obtained by the CDC unaware sequential clock gating. In comparison, the state-of-the-art two-pass solution is leading to an almost complete loss of power savings.
  • Keywords
    clocks; combinational circuits; integrated circuit manufacture; logic design; clock domain crossing; clock power; combinational clock gating; electronics; fabricated chip; sequential clock gating; Algorithm design and analysis; Clocks; Logic gates; Observability; Optimization; Registers; Synchronization; Clock Domain Crossing; Observability; Power Analysis; Power Optimization; Sequential Analysis; Sequential Clock Gating; Sequential Optimization; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092349