DocumentCode :
703798
Title :
An energy efficient backup scheme with low inrush current for nonvolatile SRAM in energy harvesting sensor nodes
Author :
Hehe Li ; Yongpan Liu ; Qinghang Zhao ; Yizi Gu ; Xiao Sheng ; Guangyu Sun ; Chao Zhang ; Meng-Fan Chang ; Rong Luo ; Huazhong Yang
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
7
Lastpage :
12
Abstract :
In modern energy harvesting sensor nodes, nonvolatile SRAM (nvSRAM) has been widely investigated as a promising on-chip memory architecture because of its zero standby power, resilience to power failures, and fast read/write operations. However, conventional approaches transfer all data from SRAM into NVM during the backup process. Thus, large on-chip energy storage capacitors are normally required. In addition, high peak inrush current is generated instantaneously, which has a negative impact on energy efficiency and circuit reliability. To mitigate these problems, we propose a novel holistic backup flow, which consists of a partial backup process and a run-time pre-writeback scheme for nvSRAM based caches. A statistics based dead-block predictor is employed to achieve a fast and low power partial backup process. We also present an adaptive pre-writeback point allocation strategy to further reduce the backup load. Simulation results show that, with our proposed backup scheme, energy storage capacitance is reduced by 34% and inrush current is reduced by 54% on average compared to the conventional full backup scheme.
Keywords :
SRAM chips; capacitor storage; electric sensing devices; energy conservation; energy harvesting; energy measurement; integrated circuit reliability; statistical analysis; NVM; adaptive pre-writeback point allocation strategy; circuit reliability; energy efficient backup scheme; energy harvesting sensor node; fast read-write operation; low inrush current; nonvolatile SRAM; nvSRAM based cache; on-chip energy storage capacitor; on-chip memory architecture; partial backup process; run-time pre-writeback scheme; statistics based dead-block predictor; zero standby power; Accuracy; Energy harvesting; Hardware; Niobium; Nonvolatile memory; Random access memory; Surges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092350
Link To Document :
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