• DocumentCode
    703814
  • Title

    Efficient soft error vulnerability estimation of complex designs

  • Author

    Mirkhani, Shahrzad ; Mitra, Subhasish ; Chen-Yong Cher ; Abraham, Jacob

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    Analyzing design vulnerability for soft errors has become a challenging process in large systems with a large number of memory elements. Error injection in a complex system with a sufficiently large sample of error candidates for reasonable accuracy takes a large amount of time. In this paper we describe RAVEN, a statistical method to estimate the outcomes of a system in the presence of soft errors injected into flip-flops, as well as the vulnerability for each memory element. This method takes advantage of fast local simulations for each error injection, and calculates the probabilities for the system outcomes for every possible soft error in a period of time. Experimental results, on an out-of-order processor with SPECINT2000 workloads, show that RAVEN is an order of magnitude faster compared with traditional error injection while maintaining accuracy.
  • Keywords
    error statistics; flip-flops; probability; radiation hardening (electronics); RAVEN; SPECINT2000 workloads; design vulnerability; error candidates; error injection; fast local simulations; flip-flops; memory elements; soft errors; statistical method; Automation; Clocks; Estimation; Hardware design languages; Mathematical model; Probability; Resilience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092366