DocumentCode
703814
Title
Efficient soft error vulnerability estimation of complex designs
Author
Mirkhani, Shahrzad ; Mitra, Subhasish ; Chen-Yong Cher ; Abraham, Jacob
Author_Institution
Univ. of Texas at Austin, Austin, TX, USA
fYear
2015
fDate
9-13 March 2015
Firstpage
103
Lastpage
108
Abstract
Analyzing design vulnerability for soft errors has become a challenging process in large systems with a large number of memory elements. Error injection in a complex system with a sufficiently large sample of error candidates for reasonable accuracy takes a large amount of time. In this paper we describe RAVEN, a statistical method to estimate the outcomes of a system in the presence of soft errors injected into flip-flops, as well as the vulnerability for each memory element. This method takes advantage of fast local simulations for each error injection, and calculates the probabilities for the system outcomes for every possible soft error in a period of time. Experimental results, on an out-of-order processor with SPECINT2000 workloads, show that RAVEN is an order of magnitude faster compared with traditional error injection while maintaining accuracy.
Keywords
error statistics; flip-flops; probability; radiation hardening (electronics); RAVEN; SPECINT2000 workloads; design vulnerability; error candidates; error injection; fast local simulations; flip-flops; memory elements; soft errors; statistical method; Automation; Clocks; Estimation; Hardware design languages; Mathematical model; Probability; Resilience;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092366
Link To Document