• DocumentCode
    703855
  • Title

    Comparative study of test generation methods for simulation accelerators

  • Author

    Kadry, Wisam ; Krestyashyn, Dimtry ; Morgenshtein, Arkadiy ; Nahir, Amir ; Sokhin, Vitali ; Jin Sung Park ; Sung-Boem Park ; Wookyeong Jeong ; Jae Cheol Son

  • Author_Institution
    IBM Res., Haifa, Israel
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    321
  • Lastpage
    324
  • Abstract
    Hardware-accelerated simulation platforms are quickly becoming a major vehicle for the functional verification of modern systems and processors. Accelerator platforms provide functional verification with valuable simulation cycles. Yet, the high cost and limited bandwidth of accelerator platforms dictate a requirement for continuous utilization improvement. In this work, we perform a comparative analysis of two approaches of test generation for accelerator platforms. An exerciser tool is used as experimental vehicle for the study. An off-platform test generation methodology is implemented and is compared to on-platform test generation typically used in exercisers. We present experimental results from simulation of latest IBM POWER8 processor on Awan accelerator platform, as well as from simulation of an eight-core ARMv8-based design on Veloce emulation platform. Our results indicate that the utilization of accelerator platforms can be improved by up to ×7 ratio when using off-platform test generation. In addition, increase of up to 24% is observed in test coverage. Off-platform mode features significantly bigger image size, but maintains tolerable build and load times.
  • Keywords
    integrated circuit design; integrated circuit testing; microprocessor chips; Awan accelerator platform; IBM POWER8 processor; Veloce emulation platform; build times; comparative analysis; continuous utilization improvement; eight-core ARMv8-based design; exerciser tool; experimental vehicle; functional verification; hardware-accelerated simulation platforms; load times; microprocessor design; off-platform test generation methodology; on-platform test generation; simulation accelerators; valuable simulation cycles; Acceleration; Computational modeling; Emulation; Generators; Life estimation; Program processors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092407