DocumentCode
703855
Title
Comparative study of test generation methods for simulation accelerators
Author
Kadry, Wisam ; Krestyashyn, Dimtry ; Morgenshtein, Arkadiy ; Nahir, Amir ; Sokhin, Vitali ; Jin Sung Park ; Sung-Boem Park ; Wookyeong Jeong ; Jae Cheol Son
Author_Institution
IBM Res., Haifa, Israel
fYear
2015
fDate
9-13 March 2015
Firstpage
321
Lastpage
324
Abstract
Hardware-accelerated simulation platforms are quickly becoming a major vehicle for the functional verification of modern systems and processors. Accelerator platforms provide functional verification with valuable simulation cycles. Yet, the high cost and limited bandwidth of accelerator platforms dictate a requirement for continuous utilization improvement. In this work, we perform a comparative analysis of two approaches of test generation for accelerator platforms. An exerciser tool is used as experimental vehicle for the study. An off-platform test generation methodology is implemented and is compared to on-platform test generation typically used in exercisers. We present experimental results from simulation of latest IBM POWER8 processor on Awan accelerator platform, as well as from simulation of an eight-core ARMv8-based design on Veloce emulation platform. Our results indicate that the utilization of accelerator platforms can be improved by up to ×7 ratio when using off-platform test generation. In addition, increase of up to 24% is observed in test coverage. Off-platform mode features significantly bigger image size, but maintains tolerable build and load times.
Keywords
integrated circuit design; integrated circuit testing; microprocessor chips; Awan accelerator platform; IBM POWER8 processor; Veloce emulation platform; build times; comparative analysis; continuous utilization improvement; eight-core ARMv8-based design; exerciser tool; experimental vehicle; functional verification; hardware-accelerated simulation platforms; load times; microprocessor design; off-platform test generation methodology; on-platform test generation; simulation accelerators; valuable simulation cycles; Acceleration; Computational modeling; Emulation; Generators; Life estimation; Program processors; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092407
Link To Document