DocumentCode :
703929
Title :
Clustering-based multi-touch algorithm framework for the tracking problem with a large number of points
Author :
Shih-Lun Huang ; Sheng-Yi Hung ; Chung-Ping Chen
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
719
Lastpage :
724
Abstract :
Microcontrollers (MCUs) are extensively used in consumer devices for specific purposes because they are tiny, cheap, and low-power. Any time-consuming algorithm and any large-size program are not suited for MCUs. Recently, we found that the conventional multi-touch algorithm becomes computationally expensive to handle the applications of large-sized touch panels. Although a more high-end MCU can obtain an improvement on speed, it would increase manufacturing cost and operating power consumption as well. In the whole multi-touch algorithm flow, point tracking is the most computationally expensive part. Fortunately, touch point tracking is similar to the pin-assignment problem in EDA. To accelerate tracking, we employ EDA techniques, such as clustering, to speed up our multi-touch algorithm. Besides, we prove that the tracking problem would be solved in O(n) time for practical cases and without losing its accuracy after clustering. Furthermore, we apply computational geometry techniques to develop an efficient clustering method. Experimental results show that clustering is efficient and effective. For the necessary requirement of large-area touch panels having 20 touch points, we can reduce the runtime by up to 70%. Besides, our multi-touch algorithm may support up to 80 touch points accompanied by a low-cost MCU.
Keywords :
computational geometry; microcontrollers; pattern clustering; touch sensitive screens; EDA techniques; clustering-based multitouch algorithm framework; computational geometry techniques; consumer devices; high-end MCU; large-sized touch panels; manufacturing cost; microcontrollers; pin-assignment problem; power consumption; touch point tracking; tracking problem; Accuracy; Clustering algorithms; Clustering methods; Runtime; Sensors; Time complexity; Tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092481
Link To Document :
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