DocumentCode
703929
Title
Clustering-based multi-touch algorithm framework for the tracking problem with a large number of points
Author
Shih-Lun Huang ; Sheng-Yi Hung ; Chung-Ping Chen
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2015
fDate
9-13 March 2015
Firstpage
719
Lastpage
724
Abstract
Microcontrollers (MCUs) are extensively used in consumer devices for specific purposes because they are tiny, cheap, and low-power. Any time-consuming algorithm and any large-size program are not suited for MCUs. Recently, we found that the conventional multi-touch algorithm becomes computationally expensive to handle the applications of large-sized touch panels. Although a more high-end MCU can obtain an improvement on speed, it would increase manufacturing cost and operating power consumption as well. In the whole multi-touch algorithm flow, point tracking is the most computationally expensive part. Fortunately, touch point tracking is similar to the pin-assignment problem in EDA. To accelerate tracking, we employ EDA techniques, such as clustering, to speed up our multi-touch algorithm. Besides, we prove that the tracking problem would be solved in O(n) time for practical cases and without losing its accuracy after clustering. Furthermore, we apply computational geometry techniques to develop an efficient clustering method. Experimental results show that clustering is efficient and effective. For the necessary requirement of large-area touch panels having 20 touch points, we can reduce the runtime by up to 70%. Besides, our multi-touch algorithm may support up to 80 touch points accompanied by a low-cost MCU.
Keywords
computational geometry; microcontrollers; pattern clustering; touch sensitive screens; EDA techniques; clustering-based multitouch algorithm framework; computational geometry techniques; consumer devices; high-end MCU; large-sized touch panels; manufacturing cost; microcontrollers; pin-assignment problem; power consumption; touch point tracking; tracking problem; Accuracy; Clustering algorithms; Clustering methods; Runtime; Sensors; Time complexity; Tracking;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location
Grenoble
Print_ISBN
978-3-9815-3704-8
Type
conf
Filename
7092481
Link To Document