• DocumentCode
    703990
  • Title

    Bordersearch: An adaptive identification of failure regions

  • Author

    Dobler, Markus ; Harrant, Manuel ; Rafaila, Monica ; Pelz, Georg ; Rosenstiel, Wolfgang ; Bogdan, Martin

  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1036
  • Lastpage
    1041
  • Abstract
    The reliability and safety of modern analog devices, e.g. in automotives, aircraft or consumer electronics, is influenced by many input parameters like supply voltage, ambient temperature or load resistances. In certain regions of this large parameter space, the device exhibits degraded performance or it fails completely. The validation of such a device has to find the regions of the input parameter space in which the device misbehaves. However, with several parameters, it is a complex task to determine these regions, especially if parameters interact. In this paper, we present the Bordersearch algorithm, which combines adaptive testing with a machine learning classifier to efficiently determine the border between passing and failing regions in the parameter space. Furthermore, this method enables sophisticated post-processing analysis, e.g. better visualizations and automatic ranking of the parameters according to their influence. This algorithm scales well to a high-dimensional parameter space and is robust against outliers and fuzzy borders. We show the effectiveness of this method on an automotive electromechanical system with eleven input parameters.
  • Keywords
    automotive electrics; automotive engineering; electrical engineering computing; failure analysis; fuzzy set theory; learning (artificial intelligence); pattern classification; reliability; Bordersearch algorithm; adaptive failure region identification; adaptive testing; analog device reliability; analog device safety; automatic parameter ranking; automotive electromechanical system; failing regions; high-dimensional parameter space; input parameter space; machine learning classifier; passing regions; sophisticated post-processing analysis; Accuracy; Aerospace electronics; Monte Carlo methods; Support vector machines; Testing; Training; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092542