• DocumentCode
    704009
  • Title

    A CNN-inspired mixed signal processor based on tunnel transistors

  • Author

    Sedighi, Behnam ; Palit, Indranil ; Hu, X. Sharon ; Nahas, Joseph ; Niemier, Michael

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1150
  • Lastpage
    1155
  • Abstract
    Novel devices are under investigation to extend the performance scaling trends that have long been associated with Moore´s Law-based device scaling. Among the emerging devices being studied, tunnel FETs (or TFETs) are particularly attractive, especially when targeting low power systems. This paper studies the potential of analog/mixed-signal information processing using TFETs. The design of a highly-parallel processor - inspired by cellular neural networks - is presented. Signal processing is performed partially in the time-domain to better leverage the unique properties of TFETs, i.e., (i) steep slopes (high gm/IDS) in the subthreshold region, and (ii) high output resistance in the saturation region. Assuming an InAs TFET with feature sizes comparable to the 14 nm technology node, a power efficiency of 10,000 GOPS/W is projected. By comparison, state-of-the-art hardware assuming CMOS technology promises a power efficiency only close to 1,000 GOPS/W.
  • Keywords
    CMOS digital integrated circuits; cellular neural nets; field effect transistors; microprocessor chips; mixed analogue-digital integrated circuits; time-domain analysis; tunnel transistors; CMOS technology; CNN-inspired mixed signal processor; Moore law-based device scaling; analog-mixed-signal information processing; cellular neural networks; high-output resistance; highly-parallel processor; indium arsenide TFET; low-power systems; performance scaling trend; power efficiency; saturation region; signal processing; steep slopes; subthreshold region; time-domain; tunnel FET; tunnel transistors; CMOS integrated circuits; Clocks; Computer architecture; Microprocessors; Power dissipation; Radiation detectors; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092561