Title :
GPU-accelerated small delay fault simulation
Author :
Schneider, Eric ; Holst, Stefan ; Kochte, Michael A. ; Xiaoqing Wen ; Wunderlich, Hans-Joachim
Author_Institution :
Univ. of Stuttgart, Stuttgart, Germany
Abstract :
The simulation of delay faults is an essential task in design validation and reliability assessment of circuits. Due to the high sensitivity of current nano-scale designs against smallest delay deviations, small delay faults recently became the focus of test research. Because of the subtle delay impact, traditional fault simulation approaches based on abstract timing models are not sufficient for representing small delay faults. Hence, timing accurate simulation approaches have to be utilized, which quickly become inapplicable for larger designs due to high computational requirements. In this work we present a waveform-accurate approach for fast high-throughput small delay fault simulation on Graphics Processing Units (GPUs). By exploiting parallelism from gates, faults and patterns, the proposed approach enables accurate exhaustive small delay fault simulation even for multimillion gate designs without fault dropping for the first time.
Keywords :
circuit CAD; fault diagnosis; graphics processing units; nanotechnology; GPU-accelerated small delay fault simulation; abstract timing models; accurate simulation approaches timing; circuit reliability assessment; delay deviations; design validation; fault simulation approaches; graphics processing units; multimillion gate designs; nano-scale designs; waveform-accurate approach; Circuit faults; Computational modeling; Delays; Instruction sets; Integrated circuit modeling; Logic gates;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8