On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

Author

Erol, Osman Emir ; Ozev, Sule ; Suresh, Chandra ; Parekhji, Rubin ; Balasubramanian, Lakshmanan

Author_Institution

Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA

fYear

2015

fDate

9-13 March 2015

Firstpage

1559

Lastpage

1562

Abstract

A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).

Keywords

CMOS digital integrated circuits; analogue-digital conversion; integrated circuit measurement; integrated circuit testing; reference circuits; voltage-controlled oscillators; ADC architecture; BGR circuit; CMOS process; analogue-to-digital converter; band-gap reference circuit; bandgap reference voltage; on-chip measurement; size 0.5 mum; small form factor VCO; voltage 50 muV; voltage controlled oscillator; voltage reference; zoom-in ADC; Calibration; Frequency measurement; Radiation detectors; System-on-chip; Voltage control; Voltage measurement; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015

Conference_Location

Grenoble

Print_ISBN

978-3-9815-3704-8

Type

conf

Filename

7092638