DocumentCode :
704106
Title :
A TSV noise-aware 3-D placer
Author :
Yu-Min Lee ; Chun Chen ; JiaXing Song ; Kuan-Te Pan
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
1653
Lastpage :
1658
Abstract :
In this work, a three-dimensional partitioning-based force-directed placer is developed to minimize coupling noise between through silicon vias (TSVs) in three-dimensional integrated circuits. TSV decoupling force is introduced and determined by the TSV coupling noise to separate TSVs with strong coupling noise. The experimental results indicate that TSV coupling noise can be effectively reduced by 36.3% on average with only 6.0% wirelength overhead. Besides, the developed 3-D placer shows great performance in wirelength that is competitive to a state-of-the-art 3-D placer.
Keywords :
integrated circuit design; integrated circuit noise; three-dimensional integrated circuits; TSV coupling noise; TSV decoupling force; TSV noise-aware 3D placer; three-dimensional integrated circuits; three-dimensional partitioning-based force-directed placer; through silicon vias; wirelength overhead; Couplings; Force; Law; Noise; Runtime; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092658
Link To Document :
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