Title :
Physical Layer Secrecy Performance of Multi-hop Decode-and-Forward Relay Networks with Multiple Eavesdroppers
Author :
Duc-Dung Tran ; Nguyen-Son Vo ; Tan-Loc Vo ; Dac-Binh Ha
Author_Institution :
Fac. of Electr. & Electron. Eng., Duy Tan Univ., Da Nang, Vietnam
Abstract :
Today, wireless networks become the most popular way to communicate. However, information can be easily eavesdropped or extracted by eavesdroppers due to the broadcast nature of wireless communication. Multi-hop relay communication systems provide for higher secrecy performance than direct transmission techniques. In this paper, the physical layer secrecy performance of multi-hop decode-and-forward (DF) relay network is investigated in the presence of multiple passive eavesdroppers over Nakagami-m fading channels. To do so, we find out the exact closed-form expressions of existence probability of secrecy capacity and secrecy outage probability by using statistical characteristics of signal-to-noise ratio (SNR). Importantly, these expressions are in more general forms compared to other results in the literature. The proposed results show a quite agreement between numerical analysis and equivalent Monte-Carlo simulations.
Keywords :
Monte Carlo methods; Nakagami channels; decode and forward communication; error statistics; numerical analysis; relay networks (telecommunication); Nakagami-m fading channels; SNR; closed-form expressions; equivalent Monte-Carlo simulations; existence probability; multihop decode-and-forward relay networks; multiple passive eavesdroppers; numerical analysis; physical layer secrecy performance; secrecy capacity; secrecy outage probability; signal-to-noise ratio; statistical characteristics; wireless communication; wireless networks; Capacity planning; Fading; Relay networks (telecommunications); Signal to noise ratio; Spread spectrum communication; Wireless communication; Decode-and-Forward; Nakagami-m fading; multi-hop relay networks; secrecy capacity;
Conference_Titel :
Advanced Information Networking and Applications Workshops (WAINA), 2015 IEEE 29th International Conference on
Conference_Location :
Gwangiu
Print_ISBN :
978-1-4799-1774-7
DOI :
10.1109/WAINA.2015.33