مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

70771

Title :

Kudos to Our Reviewers

Author :

Oates, Anthony S.

Volume :

Issue :

fYear :

2014

fDate :

Dec. 2014

Firstpage :

941

Lastpage :

941

Abstract :

Lists the reviewers who contributed to IEEE Transactions on Device and Materials Reliability in 2014.

Keywords :

IEEE publishing;

fLanguage :

English

Journal_Title :

Device and Materials Reliability, IEEE Transactions on

Publisher :

ieee

ISSN :

1530-4388

Type :

jour

DOI :

10.1109/TDMR.2014.2371511

Filename :

6971564

Link To Document :