• DocumentCode
    707976
  • Title

    Using only redundant modules with approximate logic to reduce drastically area overhead in TMR

  • Author

    Gomes, Iuri A. C. ; Martins, Mayler ; Reis, Andre ; Lima Kastensmidt, Fernanda

  • Author_Institution
    Inst. de Inf., UFRGS Porto Alegre, Rio Grande, Brazil
  • fYear
    2015
  • fDate
    25-27 March 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The use of Triple Modular Redundancy (TMR) with majority voters can guarantee full single fault masking coverage for a given circuit against transient faults. However, it presents a minimum area overhead of 200% compared to the original circuit. In order to reduce area overhead drastically without compromising significantly the fault coverage, TMR can use approximated logic circuits approach to generate redundant modules that are optimized in area compared to the original module. In this work, we propose the use of only approximate logic modules to compose the TMR in order to reduce the area overhead close to zero percent. We use a boolean factoration method to compute approximate functions and to select the best combinations of approximate logic. The circuits are implemented in complex gates and we employ structural reorder techniques to target the highest fault coverage. All the tests are done using a fault injection tool designed specifically to cope with logic gate and transistor description level. Results show that area overhead can be reduced from 200% to 120% and still reaching fault coverage of more than 95%. And when reaching 0% of area overhead, fault coverage masking can reach 75%.
  • Keywords
    approximation theory; fault diagnosis; logic circuits; logic design; logic gates; redundancy; Boolean factoration method; TMR; approximated logic circuit approach; fault injection tool design; logic gate; single fault masking coverage; structural reorder technique; transient fault coverage; triple modular redundancy; Approximation algorithms; Approximation methods; Circuit faults; Redundancy; Transient analysis; Transistors; Tunneling magnetoresistance; Approximated circuit; TMR; Transient Faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (LATS), 2015 16th Latin-American
  • Conference_Location
    Puerto Vallarta
  • Type

    conf

  • DOI
    10.1109/LATW.2015.7102522
  • Filename
    7102522