Title :
Accelerated reliability test method for optics in LED luminaire applications
Author :
Yazdan Mehr, M. ; van Driel, W.D. ; Zhang, G.Q.
Author_Institution :
Mater. Innovation Inst. (M2i), Delft, Netherlands
Abstract :
A high accelerated stress testing (HAST) system is introduced to study the photo-thermal stability and reliability of remote phosphor plates, made from Bisphenol-A polycarbonate (BPA-PC) and YAG. Remote phosphor plates, combined with a blue-light LED source, are used to produce white light with a correlated colour temperature (CCT) of 4000 K. In this study, the remote-phosphor BPA-PC samples of 3 mm thickness were photo-thermally aged at temperature range 80 to 120 °C. The blue light is radiated on the sample with light intensity of 13200 W/m2. Thermal quenching of the YAG samples is also studied. It is shown that crystallographic structure of phosphor is stable during thermal ageing.
Keywords :
ageing; life testing; light emitting diodes; optical testing; phosphors; photothermal effects; quenching (thermal); yttrium compounds; BPA-PC; CCT; HAST; LED luminaire; YAG; accelerated reliability test method; bisphenol-A polycarbonate; correlated colour temperature; crystallographic structure; high accelerated stress testing; photothermal ageing; photothermal stability; reliability; size 3 mm; temperature 4000 K; temperature 80 degC to 120 degC; thermal quenching; Heating; Length measurement; Luminescence; Out of order; Phosphors; Reliability; Thermal quenching;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
DOI :
10.1109/EuroSimE.2015.7103127
