DocumentCode :
708102
Title :
Numerical investigation of ceramic package/ interposer interconnects using isotropic conductive adhesive
Author :
Hamou, R. Faycal ; Dalsjo, Per ; Dorum, Cato ; Helland, Susanne ; Kristiansen, Helge ; Taklo, Maaike M. Visser ; Gakkestad, Jakob
Author_Institution :
Microsyst. & Nanotechnol. (MiNaLab), SINTEF ICT, Oslo, Norway
fYear :
2015
fDate :
19-22 April 2015
Firstpage :
1
Lastpage :
5
Abstract :
The aim of this study is to investigate the applicability of using an epoxy based isotropic conductive adhesive (ICA), to mount a silicon 3D system-on chip (SoC) in a ceramic 16 pad leadless chip carrier (LCC). We present and discuss thermo-mechanical FEA simulation results obtained by implementing the viscoelastic properties of the adhesive. A generalized Maxwell model using Prony series was considered in this study. We analyse the generated strain and stress in the ICA interconnect as a function of the adhesive geometry for two high and low operating temperatures. The goal is to define an optimal volume and geometry of the cured adhesive with respect to minimized stress at the interfaces between the pads and the adhesive. The target is to reduce the risk of crack initiation and propagation caused by thermal stress by careful design.
Keywords :
ceramic packaging; conductive adhesives; elemental semiconductors; integrated circuit interconnections; integrated circuit packaging; silicon; system-on-chip; thermal stress cracking; ICA interconnect; Maxwell model; Prony series; Si; adhesive geometry; ceramic package; crack initiation; crack propagation; epoxy ICA; interposer interconnects; isotropic conductive adhesive; leadless chip carrier; silicon 3D system-on chip; thermal stress; thermomechanical FEA simulation; viscoelastic property; Geometry; Gold; Mechanical factors; Micromechanical devices; Periodic structures; Silicon; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
Type :
conf
DOI :
10.1109/EuroSimE.2015.7103144
Filename :
7103144
Link To Document :
بازگشت