Title :
Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations
Author :
Kolchuzhin, Vladimir ; Mehner, Jan ; Sheremet, Evgeniya ; Kunal, Bhattacharya ; Rodriguez, Raul D. ; Zahn, Dietrich R. T.
Author_Institution :
Microsyst. & Biomed. Eng., Tech. Univ. Chemnitz, Chemnitz, Germany
Abstract :
This article deals with the models development and FE simulations for mechanical properties of all-metal AFM-TERS tips and electric field enhancement between the tip and the sample. The most important aspects in simulations, the parameters necessary in creating models, and the obtained results are presented and discussed in the article.
Keywords :
Raman spectra; Raman spectroscopy; atomic force microscopy; finite element analysis; all-metal AFM-TERS tips; electric field enhancement; mechanical properties; multiphysics finite element simulations; tip-enhanced Raman spectroscopy; Frequency measurement; Gold; Optical imaging; Optical refraction; Optical scattering; Predictive models;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
DOI :
10.1109/EuroSimE.2015.7103161
