DocumentCode :
708251
Title :
100-V 2-MHz isolated QSW-ZVS three-level DC-DC converter with on-chip dynamic dead-time controlled synchronous gate driver for eGaN power FETs
Author :
Jing Xue ; Lin Cong ; Hoi Lee
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2015
fDate :
15-19 March 2015
Firstpage :
451
Lastpage :
454
Abstract :
This paper presents techniques for high-voltage converters to achieve high power efficiency at high switching frequency. A quasi-square-wave zero-voltage switching isolated three-level half-bridge architecture is proposed to minimize the converter switching loss under high-voltage high-frequency conditions. A synchronous three-level gate driver with dynamic dead-time control is also developed to ensure reliability of all eGaN power FETs, automatically generate appropriate dead-time for all power FETs to achieve ZVS with minimal reverse bias behavior, and provide fast propagation delays for high-frequency converter operation. Implemented in a 0.5-μm HV CMOS process, the proposed gate driver achieves 15ns propagation delays and enables a 100V 35W isolated three-level half-bridge converter to achieve the peak power efficiencies of 95.2% and 90.7% at 1MHz and 2MHz, respectively.
Keywords :
CMOS integrated circuits; DC-DC power convertors; III-V semiconductors; driver circuits; field effect transistor circuits; gallium compounds; power field effect transistors; switching convertors; wide band gap semiconductors; zero voltage switching; GaN; HV CMOS process; converter switching loss reduction; eGaN power FET reliability; fast propagation delays; frequency 1 MHz; frequency 2 MHz; high power efficiency; high switching frequency; high-voltage converters; high-voltage high-frequency conditions; isolated QSW-ZVS three-level DC-DC converter; minimal reverse bias behavior; on-chip dynamic dead-time controlled synchronous gate driver; power 35 W; quasisquare-wave zero-voltage switching isolated three-level half-bridge architecture; size 0.5 mum; synchronous three-level gate driver; time 15 ns; voltage 100 V; Capacitors; Field effect transistors; Logic gates; Propagation delay; Switches; System-on-chip; Zero voltage switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location :
Charlotte, NC
Type :
conf
DOI :
10.1109/APEC.2015.7104389
Filename :
7104389
Link To Document :
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