Title :
New single-bias all-optical ETO configuration for a 15 kV-100A SiC thyristor eliminating the turn-on leakage current
Author :
Riazmontazer, Hossein ; Mojab, Alireza ; Rahnamaee, Arash ; Mehrnami, Siamak ; Mazumder, Sudip K. ; Zefran, Milos
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Chicago, IL, USA
Abstract :
In this paper a new single-bias optically-triggered (OT) emitter-turn-off (ETO) configuration for a 15kV-100A SiC thyristor, used in the next generation high-voltage high-frequency and high-power-density applications is outlined. Optical turn-off and turn-on of the OT ETO is achieved using an auxiliary optically-triggered power transistor (OTPT) in the anode path of the SiC thyristor. Leakage current during the turn-on transition of OT ETO is caused by the undesired activation of the turn-off path of the gate of the thyristor. This undesired activation is due to parasitic inductances and high di/dt in the commutation path, resulting in additional switching loss and electro-magnetic noise. In contrast to other works, the proposed method removes the leakage current enhancing the switching performance, reducing the switching loss and EMI. The other feature of the proposed work is using a single high-voltage bias eliminating the need for low-voltage (LV) control bias and devices in conventional methods. The system reliability is increased via using optical link to turn the SiC thyristor on and off, precluding the susceptibility to external noise. The proposed method and the OTPT are respectively verified through simulation and experimental results.
Keywords :
commutation; electromagnetic interference; leakage currents; optical links; optical susceptibility; photothyristors; power transistors; semiconductor device reliability; silicon compounds; EMI reduction; LV control bias; OTPT; SiC; SiC thyristor elimination; commutation path; current 100 A; electromagnetic noise; high-voltage bias elimination; low-voltage control bias; optical link; optically-triggered power transistor; parasitic inductance; single-bias OT ETO configuration; single-bias optically-triggered emitter-turn-off configuration; switching loss reduction; system reliability; turn-on leakage current; voltage 15 kV; Leakage currents; Logic gates; MOSFET; Optical switches; Silicon carbide; Stimulated emission; Thyristors;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location :
Charlotte, NC
DOI :
10.1109/APEC.2015.7104507