DocumentCode :
708520
Title :
Measuring reliability during product development considering aleatory and epistemic uncertainty
Author :
Zhiguo Zeng ; Rui Kang ; Meilin Wen ; Yunxia Chen
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2015
fDate :
26-29 Jan. 2015
Firstpage :
1
Lastpage :
6
Abstract :
Traditionally, reliability engineers use probabilistic reliability metrics (e.g., the probability of failures) to measure a product´s reliability. In the product development phase, the probabilistic reliability metrics are predicted by developing physics-of-failure-based (PoF-based) models to calculate the time-to-failure (TTF) and propagating the uncertainty in the model parameters. The prediction method only considers aleatory uncertainty (the variability of the parameters). In real cases, however, products are also exposed to epistemic uncertainty, which is the result of our incomplete knowledge of failures. In order to measure reliability in presence of both aleatory and epistemic uncertainty, belief reliability, a new reliability metric is defined in this paper and an evaluation method for the belief reliability is proposed. Epistemic uncertainty is incorporated in the evaluation by assessing the performances of the reliability techniques implemented in the product development phase. The applications of the metric and the evaluation method are illustrated through an example. The result indicates that the probabilistic reliability metrics ignore the epistemic uncertainty and overestimate the reliability. Thus, belief reliability is a more appropriate reliability metric for the product development phase.
Keywords :
probability; product development; reliability; PoF-based model; TTF; aleatory uncertainty; belief reliability; epistemic uncertainty; parameter variability; physics-of-failure-based model; probabilistic reliability metrics; product development; product reliability; reliability measurement; time-to-failure; uncertainty propagation; Mathematical model; Measurement uncertainty; Predictive models; Reliability engineering; Uncertainty; aleatory uncertainty; epistemic uncertainty; reliability evaluation; reliability metrics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2015 Annual
Conference_Location :
Palm Harbor, FL
Print_ISBN :
978-1-4799-6702-5
Type :
conf
DOI :
10.1109/RAMS.2015.7105067
Filename :
7105067
Link To Document :
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